Reconstruction of three-dimensional chemistry and geometry using focused ion beam microscopy
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Robert Hull | R. Hull | D. Dunn | D. N. Dunn
[1] H. Schiøtt. Approximations and interpolation rules for ranges and range stragglings , 1970 .
[2] A. Fenster,et al. Use of image depth profiling SIMS for the study of tinplate corrosion , 1994 .
[3] Manfred Grasserbauer,et al. Three dimensional ultra trace analysis of materials , 1992 .
[4] G. Morrison,et al. Secondary Ion Mass Spectrometric Image Depth Profiling for Three-Dimensional Elemental Analysis. , 1982 .
[5] W. Steiger,et al. Sputter redeposition as a limit to spatially three-dimensional SIMS microanalysis , 1988 .
[6] P. Townsend,et al. Ion implantation, sputtering and their applications , 1976 .
[7] W. Steiger,et al. New Developments in Spatially Multidimensional Ion Microprobe Analysis , 1983 .
[8] N. McIntyre,et al. Topographic Correction of 3D SIMS Images , 1997 .
[9] J. Ward,et al. A mass‐separating focused‐ion‐beam system for maskless ion implantation , 1981 .
[10] G. Stingeder,et al. Trends in surface and interface analysis , 1993 .
[11] P. Sigmund. Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets , 1969 .
[12] Jon Orloff,et al. High‐resolution focused ion beams , 1993 .
[13] H. Komatsubara,et al. High spatial resolution 3D analysis of materials using gallium focused ion beam secondary ion mass spectrometry (FIB SIMS) , 1998 .