Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment
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Zhili Chen | Tianming Ni | Zhengfeng Huang | Aibin Yan | Xiaoqing Wen | Jie Cui | Patrick Girard | Yuanjie Hu | P. Girard | Yuanjie Hu | X. Wen | Zhengfeng Huang | Tianming Ni | Aibin Yan | Zhili Chen | Jie Cui
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