Visually Inspecting Specular Surfaces: A Generalized Image Capture and Image Description Approach

Image capturing and image content description can be regarded as the two major steps of a computer vision process. This paper focuses on both within the field of specular surface inspection, by generalizing a previously defined stripe-based inspection method to free-form surfaces on the basis of a specific stripe illumination technique and by outlining a general feature-based stripe image characterization approach by means of new theoretical concepts. One major purpose of this paper is to propose a general stripe image interpretation approach on the basis of a three-step procedure: 1) comparison of different image content description techniques, 2) fusion of the most appropriate ones, and 3) selection of the optimal features. It is shown that this approach leads to an increase in the classification rates of more than 2 percent between the initial fused set and the selected one. The new contributions encompass 1) the generalization of a cylindrical specular surface enhancement technique to more complex specular geometries, 2) the generalization of the previously defined stripe image description by using the same number of features for the bright and the dark stripes, and 3) the definition of an optimal, in terms of classification rates and computational costs, stripe feature set.

[1]  Ron Kohavi,et al.  Wrappers for Feature Subset Selection , 1997, Artif. Intell..

[2]  R. Woodham,et al.  Photometric Stereo: Lambertian Reflectance and Light Sources with Unknown Direction and Strength , 1991 .

[3]  Huang Zhi,et al.  Interpretation and classification of fringe patterns , 1992, Proceedings., 11th IAPR International Conference on Pattern Recognition. Vol. III. Conference C: Image, Speech and Signal Analysis,.

[4]  Robert M. Haralick,et al.  Textural Features for Image Classification , 1973, IEEE Trans. Syst. Man Cybern..

[5]  Salah Bourennane,et al.  Specific features for the analysis of fringe images , 2008 .

[6]  Wolfgang Osten,et al.  Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors , 2001, J. Electronic Imaging.

[7]  Anil K. Jain,et al.  Texture Analysis , 2018, Handbook of Image Processing and Computer Vision.

[8]  Carla E. Brodley,et al.  Unsupervised Feature Selection Applied to Content-Based Retrieval of Lung Images , 2003, IEEE Trans. Pattern Anal. Mach. Intell..

[9]  Mark S. Nixon,et al.  Statistical geometrical features for texture classification , 1995, Pattern Recognit..

[10]  Lee E. Weiss,et al.  Specular surface inspection using structured highlight and Gaussian images , 1990, IEEE Trans. Robotics Autom..

[11]  S. Salzberg,et al.  INSTANCE-BASED LEARNING : Nearest Neighbour with Generalisation , 1995 .

[12]  Leo Breiman,et al.  Bagging Predictors , 1996, Machine Learning.

[13]  Joan S. Weszka,et al.  A survey of threshold selection techniques , 1978 .

[14]  Anand Asundi,et al.  Fault detection by interferometric fringe pattern analysis using windowed Fourier transform , 2005 .

[15]  Fernando Puente Leon,et al.  Active vision and sensor fusion for inspection of metallic surfaces , 1997, Other Conferences.

[16]  Anil K. Jain,et al.  Simultaneous feature selection and clustering using mixture models , 2004, IEEE Transactions on Pattern Analysis and Machine Intelligence.

[17]  Anil K. Jain,et al.  Small Sample Size Effects in Statistical Pattern Recognition: Recommendations for Practitioners , 1991, IEEE Trans. Pattern Anal. Mach. Intell..

[18]  Anil K. Jain,et al.  A wrapper-based approach to image segmentation and classification , 2004, IEEE Transactions on Image Processing.

[19]  R. SEULIN,et al.  MACHINE VISION SYSTEM FOR SPECULAR SURFACE INSPECTION : USE OF SIMULATION PROCESS AS A TOOL FOR DESIGN AND OPTIMIZATION , .

[20]  Salah Bourennane,et al.  New Structured Illumination Technique for the Inspection of High-Reflective Surfaces: Application for the Detection of Structural Defects without any Calibration Procedures , 2008, EURASIP J. Image Video Process..

[21]  Sören Kammel,et al.  Deflektometrische Untersuchung spiegelnd reflektierender Freiformflächen , 2005 .

[22]  S. Sathiya Keerthi,et al.  Improvements to Platt's SMO Algorithm for SVM Classifier Design , 2001, Neural Computation.

[23]  Ricardo Gutierrez-Osuna,et al.  Pattern analysis for machine olfaction: a review , 2002 .

[24]  Wolfgang Osten,et al.  Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors , 2000, Electronic Imaging.

[25]  M. Takeda,et al.  Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry , 1982 .

[26]  Franz Pernkopf,et al.  Visual Inspection of Machined Metallic High-Precision Surfaces , 2002, EURASIP J. Adv. Signal Process..

[27]  Thomas Wagner,et al.  Automatic configuration of surface inspection systems , 1997, Electronic Imaging.

[28]  Bernard Lamalle,et al.  Study of the imaging conditions and processing for the aspect control of specular surfaces , 2001, J. Electronic Imaging.

[29]  Xide Li Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry , 2000 .

[30]  Trygve Randen,et al.  Filtering for Texture Classification: A Comparative Study , 1999, IEEE Trans. Pattern Anal. Mach. Intell..

[31]  Mark A. Hall,et al.  Correlation-based Feature Selection for Machine Learning , 2003 .

[32]  M.A. Dominguez,et al.  Machine-vision based detection for sheet metal industries , 1999, IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029).

[33]  P. O'Leary,et al.  Instrumentation and Measurement Method for the Inspection of peeled Steel Rods , 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

[34]  Fuhui Long,et al.  Feature selection based on mutual information criteria of max-dependency, max-relevance, and min-redundancy , 2003, IEEE Transactions on Pattern Analysis and Machine Intelligence.

[35]  Wolfgang Osten,et al.  Application of neural networks and knowledge-based systems for automatic identification of fault-indicating fringe patterns , 1994, Other Conferences.