论文信息 - A Comparative Study of AC Positive Bias Temperature Instability of Germanium nMOSFETs With GeO₂/Ge and Si-cap/Ge Gate Stack - 字舞流文

A Comparative Study of AC Positive Bias Temperature Instability of Germanium nMOSFETs With GeO₂/Ge and Si-cap/Ge Gate Stack

Z. Ji | Y. En | Hong Yang | Yun Huang | Xiaoling Lin | R. Gao | Jigang Ma | Xiaowen Zhang | Jianfu Zhang | G. Lu | Weidong Zhang