Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever.

Lateral vibration of the tip in atomic force microscopy was mapped at the torsional resonance of the cantilever by attaching a shear piezo element at the base of the cantilever or under the sample. Fixed frequency excitation and self-excitation of torsional motion were implemented. The lateral vibration utilized as measured by an optical lever was in the order of 10 pm to 3 nm, and its frequency approximately 450 kHz for a contact-mode silicon nitride cantilever. The amplitude and phase of the torsional motion of the cantilever was measured by a lock-in-amplifier or a rectifier and plotted in x and y as the sample was raster scanned. The imaging technique gave contrast between graphite terraces, self-assembled monolayer domains, silicon and silicon dioxide, graphite and mica. Changing contrast was observed as silicon islands oxidized in atmosphere, showing that the imaging technique can detect change in lateral tip mobility due to changes occurring near the surface. Torsional self-excitation showed nanometric features of self-assembled monolayer islands due to different lateral dissipation. Dependence of torsional resonance frequency on excitation amplitude, and contrast change due to driving frequency around resonance were observed.

[1]  Ryutaro Maeda,et al.  Evaluation of the Elastic Properties of a Cantilever Using Resonant Frequencies , 1997 .

[2]  C. Heiden,et al.  A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope , 1994 .

[3]  Joseph A. Turner,et al.  Sensitivity of flexural and torsional vibration modes of atomic force microscope cantilevers to surface stiffness variations , 2001 .

[4]  Joseph A. Turner,et al.  Analysis of the high-frequency response of atomic force microscope cantilevers , 1997 .

[5]  Marco Salerno,et al.  NORMAL AND LATERAL FORCES IN SCANNING FORCE MICROSCOPY , 1994 .

[6]  Ricardo Garcia,et al.  Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy , 1999 .

[7]  N. Amer,et al.  Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope , 1990 .

[8]  C. Duschl,et al.  Shear force surface contrast on self-assembly monolayers , 2000 .

[9]  Kazushi Yamanaka,et al.  Ultrasonic Atomic Force Microscope with Overtone Excitation of Cantilever , 1996 .

[10]  Kazushi Yamanaka,et al.  Quantitative material characterization by ultrasonic AFM , 1999 .

[11]  Keiichi Nakamoto,et al.  Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy , 2001 .

[12]  Tsuyoshi Mihara,et al.  Nanoscale elasticity measurement with in situ tip shape estimation in atomic force microscopy , 2000 .

[13]  M. Welland,et al.  Atomic force microscope study of boundary layer lubrication , 1992 .

[14]  O. Marti,et al.  Dynamic friction force measurement with the scanning force microscope , 1999 .

[15]  A. Baró,et al.  Lock‐in technique for measuring friction on a nanometer scale , 1996 .

[16]  G. McClelland,et al.  Atomic-scale friction of a tungsten tip on a graphite surface. , 1987, Physical review letters.

[17]  Pascal Gallo,et al.  How does a tip tap? , 1997 .

[18]  Robert W. Stark,et al.  Tapping-mode atomic force microscopy and phase-imaging in higher eigenmodes , 1999 .

[19]  P. Hansma,et al.  Using force modulation to image surface elasticities with the atomic force microscope , 1991 .

[20]  S. K. Biswas,et al.  Measurements of stiff-material compliance on the nanoscale using ultrasonic force microscopy , 2000 .

[21]  O. Marti,et al.  Combined dynamic adhesion and friction measurement with the scanning force microscope , 2000 .

[22]  Oliver B. Wright,et al.  Vibrational dynamics of force microscopy: Effect of tip dimensions , 1997 .

[23]  Kei Kobayashi,et al.  Resonance tracking ultrasonic atomic force microscopy , 2002 .

[24]  P. Vairac,et al.  Scanning microdeformation microscopy in reflection mode , 1996 .

[25]  Bharat Bhushan,et al.  Lateral force microscopy using acoustic friction force microscopy , 1999 .

[26]  Oleg Kolosov,et al.  Ultrasonic force microscopy for nanometer resolution subsurface imaging , 1994 .

[27]  K. Yamanaka,et al.  Lateral Force Modulation Atomic Force Microscope for Selective Imaging of Friction Forces , 1995 .

[28]  H. Kawakatsu,et al.  Scanning force microscopy with two optical levers for detection of deformations of the cantilever , 1996 .

[29]  P. Boillat,et al.  Theoretical and experimental study of the forces between different SNOM probes and chemically treated AFM cantilevers , 2000, Proceedings of the IEEE.

[30]  K. Yamanaka,et al.  Lateral Force Modulation Atomic Force Microscopy of Langmuir-Blodgett Film in Water , 1996 .

[31]  Kenneth B. Crozier,et al.  Contact stiffness of layered materials for ultrasonic atomic force microscopy , 2000 .

[32]  P. Hansma,et al.  An atomic-resolution atomic-force microscope implemented using an optical lever , 1989 .

[33]  H. K. Wickramasinghe,et al.  Differential scanning tunnelling microscopy , 1988 .

[34]  Toshiro Higuchi,et al.  Crystalline lattice for metrological applications and positioning control by a dual tunneling‐unit scanning tunneling microscope , 1991 .

[35]  Sokolov,et al.  Shear modulation force microscopy study of near surface glass transition temperatures , 2000, Physical review letters.

[36]  Robert W. Carpick,et al.  Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy , 1997 .

[37]  A. Spychalski-Merle.  Friction contrast in resonant cantilever vibration mode , 2000 .

[38]  O. Marti,et al.  Mapping of electrical double-layer force between tip and sample surfaces in water with pulsed-force-mode atomic force microscopy , 1997 .

[39]  Rolf Möller,et al.  ``Tracking'' tunneling microscopy , 1988 .

[40]  Hideki Kawakatsu,et al.  Velocity Dependence and Limitations of Friction Force Microscopy of Mica and Graphite , 2000 .

[41]  W. Arnold,et al.  Theoretical description of the transfer of vibrations from a sample to the cantilever of an atomic force microscope , 1997 .

[42]  V. Scherer,et al.  Local Elasticity and Lubrication Measurements Using Atomic Force And Friction Force Microscopy At Ultrasonic Frequencies , 1997, 1997 IEEE International Magnetics Conference (INTERMAG'97).

[43]  Masahiro Ohta,et al.  Difference between the forces measured by an optical lever deflection and by an optical interferometer in an atomic force microscope , 1994 .