Direct Surface Tension Measurements of Individual Sub-Micrometer Particles Using Atomic Force Microscopy.
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Armando D. Estillore | A. Tivanski | V. Grassian | K. Ray | Hansol D. Lee | Holly S. Morris | Aldair Alejandro | A. Estillore
暂无分享，去创建一个
Armando D. Estillore | A. Tivanski | V. Grassian | K. Ray | Hansol D. Lee | Holly S. Morris | Aldair Alejandro | A. Estillore