Analog-to-digital converter modeling: a survey
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[1] G. Ruan. A behavioral model of A/D converters using a mixed-mode simulator , 1991 .
[2] Douglas W. Doerfler. Dynamic testing of a slow sample rate, high-resolution data acquisition system , 1986, IEEE Transactions on Instrumentation and Measurement.
[3] J. Gray,et al. A Precision Sample and Hold Circuit with Subnanosecond Switching , 1964 .
[4] Johan Schoukens,et al. Dynamic testing and diagnostics of A/D converters , 1986 .
[5] D. M. Hummels,et al. Improved compensation for analog-to-digital converters , 1991 .
[6] A. Baccigalupi,et al. An improved error model of data acquisition systems , 1993, 1993 IEEE Instrumentation and Measurement Technology Conference.
[7] A. Baccigalupi,et al. Error compensation of A/D converters using neural networks , 1995, Proceedings of 1995 IEEE Instrumentation and Measurement Technology Conference - IMTC '95.
[8] Pasquale Arpaia,et al. Testing Uncertainty of Scan Converter-Based Transient Digitizers , 1995 .
[9] Pasquale Daponte,et al. A behavioural model for scan converter-based transient digitizers , 1996 .
[10] Pasquale Arpaia,et al. Techniques of improved signal extraction in scan conversion-based transient digitizers , 1996 .
[11] P. Daponte,et al. Dynamic characterization of scan conversion-based transient digitizers , 1994, Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9).
[12] J. Kuffel,et al. Modeling of the dynamic performance of transient recorders used for high voltage impulse tests , 1991 .
[13] I. Kale,et al. Some theorems on Walsh transforms of quantizer differential and integral nonlinearity , 1991, [1991] Conference Record. IEEE Instrumentation and Measurement Technology Conference.
[14] H.-C. Liu,et al. A framework for design and testing of analog integrated circuits , 1990 .
[15] B. K. Bhagavan,et al. Evaluating analog-to-digital converters , 1975 .
[16] Ryszard Malewski,et al. Measuring Characteristics of the Fastest Commercially-Available Digitizers , 1987, IEEE Transactions on Power Delivery.
[17] S. Mitra,et al. Analysis of mismatch effects among A/D converters in a time-interleaved waveform digitizer , 1991 .
[18] P. Daponte,et al. An ADC error model for testing digitizing signal analyzers , 1992 .
[19] Yih-Chyun Jenq,et al. Measuring harmonic distortion and noise floor of an A/D converter using spectral averaging , 1988 .