Effects of Mg Suppressor Layer on the InZnSnO Thin-Film Transistors
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Dae Hwan Kim | Chang-Woo Song | Yong-Jin Choi | Sang-Hun Song | Kyung-Hyun Kim | Hyuck-In Kwon | Woo-Seok Cheong | Jae-Heon Shin | Ji-Woong Yang | Chan-Hwa Hong | H. Kwon | Yong-Jin Choi | W. Cheong | Sang-Hun Song | C. Hong | Jae‐heon Shin | Kyung‐Hyun Kim | Daehwan Kim | Chang-Woo Song | Ji-Woong Yang
[1] H. Ohta,et al. Carrier transport and electronic structure in amorphous oxide semiconductor, a-InGaZnO4 , 2005 .
[2] B. Ryu,et al. O-vacancy as the origin of negative bias illumination stress instability in amorphous In-Ga-Zn-O thin film transistors , 2010, 1006.4913.
[3] Marius Grundmann,et al. MESFET Electronics: Recent Progress on ZnO‐Based Metal‐Semiconductor Field‐Effect Transistors and Their Application in Transparent Integrated Circuits (Adv. Mater. 47/2010) , 2010 .
[4] Norihiko Tamaki,et al. Ferroelectric properties in piezoelectric semiconductor Zn1-xMxO (M=Li, Mg) , 1997 .
[5] Mamoru Furuta,et al. Self-Aligned Bottom-Gate In—Ga—Zn—O Thin-Film Transistor With Source/Drain Regions Formed by Direct Deposition of Fluorinated Silicon Nitride , 2014, IEEE Electron Device Letters.
[6] Rino Choi,et al. Achieving High Field-Effect Mobility Exceeding 50 cm \(^{\mathrm {2}}\) /Vs in In-Zn-Sn-O Thin-Film Transistors , 2014, IEEE Electron Device Letters.
[7] Chun-Yu Wu,et al. Reliability improvement of InGaZnO thin film transistors encapsulated under nitrogen ambient , 2012 .
[8] Jang-Yeon Kwon,et al. The effect of moisture on the photon-enhanced negative bias thermal instability in Ga-In-Zn-O thin film transistors , 2009 .
[9] Masashi Kasami,et al. High-Performance Thin Film Transistor with Amorphous In2O3–SnO2–ZnO Channel Layer , 2012 .
[10] Mohamed Faiz,et al. XPS study of nitrogen-implanted ZnO thin films obtained by DC-Magnetron reactive plasma , 2008 .