Characterization of fractal surfaces

Fractal profiles are generated and analyzed. It is found that the root mean square (rms) slope and curvature can be obtained from the structure function. Also, it is found that rms curvature is a good estimate of asperity curvature. Finally, a bifractal surface is analyzed. It is found that the critical wave number of the spectral density does not correspond to the critical length of the structure function. Again, the rms curvature is a good estimate for the asperity curvature of bifractal surfaces.

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