论文信息 - Scanning tunneling microscopy of Si/SiO2 interface roughness and its dependence on growth conditions - 字舞流文

Scanning tunneling microscopy of Si/SiO2 interface roughness and its dependence on growth conditions

D. P. Runthala | K. Garg | G. Shekhawat | P. Srivastava | R. Gupta | P. Vyas | S. Venkatesh | S. Shekhawat | K. Mamhoud