Characterization of AlN metal-semiconductor-metal diodes in the spectral range of 44–360nm: Photoemission assessments
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U. Kroth | M. Richter | J. Lin | Hongxing Jiang | A. Soltani | J. D. Jaeger | R. Dahal | A. Benmoussa | J. Li | J. Hochedez | A. BenMoussa