The changing role of DIAGNOSIS in YIELD ANALYSIS

Test-failure data contains a wealth of information that can accelerate the yield-analysis process for semiconductor devices. By setting up an infrastructure that captures and automatically diagnoses each manufacturing test failure, you can create a valuable database of information based on actual silicon results. When you couple this database with a diagnosis-driven yield-analysis tool that performs statistical analysis on this large volume of diagnosis data, you can significantly reduce the time needed to recognize systematic yield issues and determine their root causes.