论文信息 - Single event effects in RF and microwave ICs

Single event effects in RF and microwave ICs

The present paper presents an overview and an analysis of single event effects (SEE) for a variety of RF and microwave ICs. New SEE test results obtained at the NRNU MEPhI test center have been used along with the published data.

D. V. Boychenko | V. V. Elesin | G. V. Chukov | K. M. Amburkin | A. G. Kuznetsov

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