High resolution imaging using scanning ion conductance microscopy with improved distance feedback control
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Chao Li | Liming Ying | David Klenerman | Yuri E. Korchev | D. Klenerman | C. Li | Y. Korchev | L. Ying | A. Shevchuk | V. Ostanin | Nicholas Johnson | Victor P. Ostanin | Andrew I. Shevchuk | Nicholas Johnson
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