Multiwavelength electronic speckle pattern interferometry for surface shape measurement.

Profilometry by electronic speckle pattern interferometry with multimode diode lasers is both theoretically and experimentally studied. The multiwavelength character of the laser emission provides speckled images covered with interference fringes corresponding to the surface relief in single-exposure processes. For fringe pattern evaluation, variations of the phase-stepping technique are investigated for phase mapping as a function of the number of laser modes. Expressions for two, three, and four modes in four and eight stepping are presented, and the performances of those techniques are compared in the experiments through the surface shaping of a flat bar. The surface analysis of a peach points out the possibility of applying the technique in the quality control of food production and agricultural research.

[1]  Real-time contour holography using BSO crystals , 1981 .

[2]  J. P. Huignard,et al.  Coherent signal beam amplification in two-wave mixing experiments with photorefractive Bi12SiO20 crystals , 1981 .

[3]  T. Eiju,et al.  Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm. , 1987, Applied optics.

[4]  J. M. Huntley.  Noise-immune phase unwrapping algorithm. , 1989, Applied optics.

[5]  G Gülker,et al.  Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields. , 1992, Applied optics.

[6]  Y. Zou,et al.  Two-wavelength DSPI surface contouring through the temperature modulation of a laser diode , 1993 .

[7]  D. Schmitt,et al.  Optimization of fringe pattern calculation with direct correlations in speckle interferometry. , 1997, Applied optics.

[8]  J E Millerd,et al.  Holographic profilometry with a rhodium-doped barium titanate crystal and a diode laser. , 1997, Applied optics.

[9]  B Frei,et al.  Additive-Subtractive Two-Wavelength ESPI Contouring by Using a Synthetic Wavelength Phase Shift. , 1998, Applied optics.

[10]  Giancarlo Pedrini,et al.  Shape measurement of microscopic structures using digital holograms , 1999 .

[11]  B Gutmann,et al.  Phase unwrapping with the branch-cut method: clustering of discontinuity sources and reverse simulated annealing. , 1999, Applied optics.

[12]  Roberto A. Braga,et al.  Assessment of Seed Viability by Laser Speckle Techniques , 2003 .

[13]  T. Harimoto.  Phase calculation based on curve fitting with a two-wavelength interferometer. , 2003, Optics express.

[14]  Mikiya Muramatsu,et al.  Two-source method in digital holographic contouring , 2004, Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications.

[15]  Qifeng Yu,et al.  Extraction of phase field from a single contoured correlation fringe pattern of ESPI. , 2004, Optics express.

[16]  Qifeng Yu,et al.  Single-phase-step method with contoured correlation fringe patterns for ESPI. , 2004, Optics express.

[17]  Mikiya Muramatsu,et al.  Single-exposure, photorefractive holographic surface contouring with multiwavelength diode lasers. , 2005, Journal of the Optical Society of America. A, Optics, image science, and vision.

[18]  Toyohiko Yatagai,et al.  Profilometry with line-field Fourier-domain interferometry. , 2005, Optics express.

[19]  E. Barbosa.  Holographic imaging with multimode, large free spectral range lasers in photorefractive sillenite crystals , 2004, physics/0407089.

[20]  E. Barbosa,et al.  Multi-wavelength holography in Bi12TiO20 crystals: Applications in refractometry , 2006 .