Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics

Abstract Experiments using high brightness X-rays are on the forefront of science due to the vast variety of knowledge they can provide. New Synchrotron Radiation (SR) and Free Electron Laser (FEL) light sources provide unique tools for advanced studies using X-rays. Top-level scientists from around the world are attracted to these beamlines to perform unprecedented experiments. High brightness, low emittance light sources allow beamline scientists the possibility to dream up cutting-edge experimental stations. X-ray optics play a key role in bringing the beam from the source to the experimental stations. This article explores the recent developments in X-ray optics. It touches on simulations, diagnostics, metrology and adaptive optics, giving an overview of the role X-ray optics have played in the recent past. It will also touch on future developments for one of the most active field in the X-ray science.

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