Bent crystal Laue analyser combined with total reflection fluorescence X-ray absorption fine structure (BCLA + TRF-XAFS) and its application to surface studies.
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T. Wada | K. Asakura | D. Kido | Y. Wakisaka | S. Takakusagi | Y. Takeichi | Kaiyue Dong | Bing Hu | Md. Harun Al Rashid | Wenhan Chen | Bapurao Bharate | Quiyi Yuan | S. Mukai