论文信息 - Residual stress and strain-free lattice-parameter depth profiles in a -Fe<sub>4</sub>N<sub>1-<italic>x</italic></sub> layer on an -Fe substrate measured by x-ray diffraction stress analysis at constant information depth - 字舞流文

Residual stress and strain-free lattice-parameter depth profiles in a -Fe₄N_1-x layer on an -Fe substrate measured by x-ray diffraction stress analysis at constant information depth

U. Welzel | M. Wohlschlögel | E. Mittemeijer