Behavioral Modeling Technique for TID Degradation of Complex Analog Circuits

A behavioral modeling technique has been developed for creating TID-aware behavioral models of voltage feedback op-amps without the creation of an underlying SPICE micro-model. The model accurately predicts the TID response of board-level designs with a 79X increase in simulation speed when compared to the SPICE model for the example application of a Schmitt trigger oscillator. This behavioral model permits the analysis of op amp characteristic sensitivity on circuit level behaviors. This type of sensitivity analysis can be particularly useful for determining which portion of a circuit is most affected by TID and where to more effectively harden a system against TID degradation.

[1]  H.J. Barnaby,et al.  Effect of amplifier parameters on single-event transients in an inverting operational amplifier , 2001, RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605).

[2]  C. T. Kleiner,et al.  An Improved Bipolar Junction Transistor Model for Electrical and Radiation Effects , 1982, IEEE Transactions on Nuclear Science.

[3]  B. Vermeire,et al.  VHDL-AMS Modeling of Total Ionizing Dose Radiation Effects on CMOS Mixed Signal Circuits , 2007, IEEE Transactions on Nuclear Science.

[4]  Edoardo Charbon,et al.  A Top-down, Constraint-Driven Design Methodology for Analog Integrated Circuits , 1993 .

[5]  R. Pease,et al.  Effect of passivation on the enhanced low dose rate sensitivity of National LM124 operational amplifiers , 2004, 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774).

[6]  A.B. Lostetter,et al.  Compact modeling of environmentally induced radiation effects on electrical devices , 2004, 2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720).

[7]  W.T. Holman,et al.  Total dose effects in a linear Voltage regulator , 2004, IEEE Transactions on Nuclear Science.