Adhesion measurement of films and coatings

Preface Interface adhesion: Measurement and analysis A.G. Evans Relative adhesion measurement for thin film microelectronic structures. Part II. L.P. Buchwalter Testing the adhesion of hard coatings including the non-destructive technique of surface acoustic waves H. Ollendorf, T. SchA lke and D. Schneider Scratch adhesion testing of coated surfaces a " Challenges and new directions J. Meneve, H. Ronkainen, P. Andersson, K. Vercammen, D. Camino, D.G. Teer, J. von Stebut, M.G. Gee, N.M. Jennett, J. Banks, B. Bellaton, E. Matthaei-Schulz and H. Vetters Can the scratch adhesion test ever be quantitative? S.J. Bull Characterisation of thin film adhesion with the Nano-Scratch Tester (NST) J.D. Holbery and R. Consiglio Scratch adhesion testing of nanophase diamond coatings on industrial substrates F. Davanloo, C.B. Collins and K.J. Koivusaari Scratch test failure modes and performance of organic coatings for marine applications S.J. Bull, K. Horvathova, I.P. Gilbert, D. Mitchell, R.I. Davidson and J.R. White An energetic approach for the evaluation of adhesion of sputter deposited TiC films on glass by the scratch test A. Kinbara, A. Sato, E. Kusano and N. Kikuchi On the evaluation of coating-substrate adhesion by indentation experiments B. Rother Measurement of interfacial fracture energy in microelectronic multifilm applications J.C. Hay, E.G. Liniger and X.H. Liu Assessment of adhesion reliability for plastic flip-chip packaging X. Dai, M.V. Brillhart and P.S. Ho Adhesion and abrasion of sputter-deposited ceramic thin films on glass S. Suzuki Improvement and testing of diamond film adhesion X.C. He, H.S. Shen, Z.M. Zhang, X.J. Hu and X.Q. Yang Effect of primer curing conditions on basecoat-primer adhesion a " A LIDS study J.S. Meth Evaluation of a pulsed laser technique for the estimation of the adhesion strength of oxide coatings onto metallic substrates G. Rosa, P. Psyllaki and R. Oltra The blade adhesion test applied to polyimide films onto silicon substrate S. Khasawinah and C.G. Smith Mechanics of the JKR (Johnson-Kendall-Roberts) adhesion test C.Y. Hui, J.M. Baney and Y.Y. Lin Revisiting bimaterial curvature measurements for CTE of adhesives D.A. Dillard and J.-H. Yu Raman spectroscopic determination of residual stresses in diamond films Q.H. Fan, J. GrA!cio and E. Pereira