Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles.
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A M MacLeod | S. Jamison | G. Berden | W. Gillespie | B. Redlich | A. V. D. van der Meer | G Berden | S P Jamison | W A Gillespie | B Redlich | A F G van der Meer | A. Macleod | Steven Jamison | Britta Redlich | A. V. D. Meer
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