Electron Microscopy: In Situ

[1]  J. Zweck,et al.  Development of a specimen holder for in situ generation of pure in-plane magnetic fields in a transmission electron microscope. , 2003, Ultramicroscopy.

[2]  S. Donnelly,et al.  Determination of interfacial tensions for Xe nanoprecipitates in Al at 300 K , 2003 .

[3]  Zhong Lin Wang.  Scanning Probe Microscopy in TEM : an In-situ Approach for Nano-scale Property Measurements , 2002, Microscopy and Microanalysis.

[4]  K. Furuya,et al.  Ordering in a Fluid Inert Gas Confined by Flat Surfaces , 2002, Science.

[5]  M. A. Haque,et al.  In-situ tensile testing of nano-scale specimens in SEM and TEM , 2002 .

[6]  P. Gai.  Development of Wet Environmental TEM (Wet-ETEM) for In Situ Studies of Liquid-Catalyst Reactions on the Nanoscale , 2002, Microscopy and Microanalysis.

[7]  B. Kabius,et al.  Benefits of a Cs-Corrector for Material Science , 2001, Microscopy and Microanalysis.

[8]  J. W. Morris,et al.  Quantitative in situ nanoindentation in an electron microscope , 2001 .

[9]  A. Minor,et al.  Development of a Nanoindenter for In Situ Transmission Electron Microscopy , 2001, Microscopy and Microanalysis.

[10]  M. Reuter,et al.  In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si (001) heterostructures , 2000 .

[11]  Gai,et al.  In Situ Real-time Environmental High Resolution Electron Microscopy of Nanometer Size Novel Xerogel Catalysts for Hydrogenation Reactions in Nylon 6,6. , 2000, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

[12]  Ross,et al.  New mechanism for dislocation blocking in strained layer epitaxial growth , 2000, Physical review letters.

[13]  K. Furuya,et al.  Behavior of Crystalline Xe Nanoprecipitates during Coalescence , 1999 .

[14]  W. D. Heer,et al.  Electrostatic deflections and electromechanical resonances of carbon nanotubes , 1999, Science.

[15]  Yukihito Kondo,et al.  Quantized conductance through individual rows of suspended gold atoms , 1998, Nature.

[16]  C. Allen,et al.  In situ transmission electron microscopy employed for studies of effects of ion and electron irradiation on materials , 1998, Microscopy research and technique.

[17]  C. Allen.  In situ ion- and electron-irradiation effects studies in transmission electron microscopes , 1994 .

[18]  D. A. Smith,et al.  In situ study of effects of ion irradiation on solid-state crystallization of cobalt disilicide thin films , 1991 .

[19]  Hannes Lichte,et al.  Optimum focus for taking electron holograms , 1991 .

[20]  O. Scherzer,et al.  Über einige Fehler von Elektronenlinsen , 1936 .

[21]  P. Hawkes.  41 – Aberration Correction , 1989 .

[22]  O. Scherzer.  The Theoretical Resolution Limit of the Electron Microscope , 1949 .