Application of signature analysis to the concurrent test of microprogrammed control units

Abstract In this paper, an architecture for a microprogrammable processor with built-in test is described. A novel approach in handling the transactions between the blocks of a microprogram for self-test is presented. The approach uses signature analysis to test the control section independent of the data section. A fault model for a microprogrammed control unit is proposed. The effects of the errors that are caused by these faults are analyzed. Effectiveness of signature analysis with respect to these errors is studied with the use of Berlekamp's algorithm. As a result, structure of the signature register that provides the best coverage is determined.

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