论文信息 - A multiline material parameter extraction method

A multiline material parameter extraction method

Material characterization is an important part of printable electronics design since material properties depend strongly on the manufacturing process. This paper introduces a novel multiline material characterization method that is applicable to the characterization of printable electronics structures as well as integrated microwave devices. The proposed technique eliminates the half-wave resonances, decrease the sensitivity to small variations in the lines and provide a weighted average from individual line pair data. The multiline extraction method is validated using full-wave simulation data, and is subsequently applied to test structures manufactured with inkjet technology.

Riku Makinen | Hannu Sillanpaa | Arttu Rasku

[1] Pauliina Mansikkamaki,et al. Application of wide-band material parameter extraction techniques to printable electronics characterization , 2009, 2009 59th Electronic Components and Technology Conference.

[2] H. Saito,et al. Evaluation of Inkjet Technology for Electronic Packaging and System Integration , 2007, 2007 Proceedings 57th Electronic Components and Technology Conference.

[3] B. Nauwelaers,et al. Accurate transmission line characterisation on high and low-resistivity substrates , 2001 .

[4] Kenichi Okada,et al. A multi-line de-embedding technique for mm-wave CMOS circuits , 2009, 2009 Asia Pacific Microwave Conference.

[5] G. F. Engen,et al. Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer , 1979 .

[6] R. Marks. A multiline method of network analyzer calibration , 1991 .

[7] A. Mangan,et al. De-embedding transmission line measurements for accurate modeling of IC designs , 2006, IEEE Transactions on Electron Devices.