Channel temperature model for microwave AlGaN/GaN power HEMTs on SiC and sapphire

A key parameter in the design trade-offs made during AlGaN/GaN HEMTs development for microwave amplifiers is the channel temperature. An accurate determination can generally only be found using detailed software; however, a quick estimate is always helpful, as it speeds up the design cycle. This paper gives a simple technique to estimate the channel temperature of a generic AlGaN/GaN HEMT on SiC or sapphire, while incorporating the temperature dependence of the thermal conductivity. The procedure is validated by comparing its predictions with the experimentally measured temperatures in microwave devices presented in three recently published articles. The model predicts the temperature to within 5 to 10 percent of the true average channel temperature.

[1]  F. N. Masana,et al.  A new approach to the dynamic thermal modelling of semiconductor packages , 2001, Microelectron. Reliab..

[2]  Harry F. Cooke,et al.  Precise technique finds FET thermal resistance , 1986 .

[3]  Agostino Giorgio,et al.  Electrothermal model of GaAs FET devices for fast PC implementation , 2001 .

[4]  Martin Kuball,et al.  Measurement of temperature distribution in multifinger AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy , 2003 .

[5]  E. Kohn,et al.  Transient characteristics of GaN-based heterostructure field-effect transistors , 2003 .

[6]  C.C. Lee,et al.  Thermal modeling and measurement of GaN-based HFET devices , 2003, IEEE Electron Device Letters.

[7]  A. S. Royet,et al.  Self-heating effects in silicon carbide MESFETs , 2000 .

[8]  Keiichi Yamamoto,et al.  Raman microprobe study on temperature distribution during cw laser heating of silicon on sapphire , 1986 .

[9]  Niccolò Rinaldi Thermal analysis of solid-state devices and circuits: an analytical approach , 2000 .

[10]  F. N. Masana,et al.  A closed form solution of junction to substrate thermal resistance in semiconductor chips , 1996 .

[11]  Umesh K. Mishra,et al.  The toughest transistor yet [GaN transistors] , 2002 .

[12]  E. Santi,et al.  An assessment of wide bandgap semiconductors for power devices , 2003 .

[13]  Fabrizio Bonani,et al.  On the application of the Kirchhoff transformation to the steady-state thermal analysis of semiconductor devices with temperature-dependent and piecewise inhomogeneous thermal conductivity , 1995 .

[14]  M. Kuball,et al.  Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy , 2002, IEEE Electron Device Letters.

[15]  Siegfried Selberherr,et al.  Thermal models for semiconductor device simulation , 1999, HITEN 99. Third European Conference on High Temperature Electronics. (IEEE Cat. No.99EX372).

[16]  Robert J. Trew,et al.  Wide bandgap semiconductor transistors for microwave power amplifiers , 2000 .