ADC HISTOGRAM TEST USING SMALL-AMPLITUDE INPUT WAVES

The experimental investigation on a histogram test for analog-to-digital converters (ADCs) using as stimulus signals small-amplitude triangular waves superimposed to variable DC levels is presented. The test allows inexpensive triangular generators to be used and a dramatic reduction of the duration of the static test for the characterisation of high-resolution ADCs. The experimental comparison of the investigated test with a fullscale wave-based test and with the standard static test for different ADC architectures highlights its effectiveness.