Shape effect of microtwins on high‐resolution transmission electron microscope images

The shape effect of microtwins on high‐resolution transmission electron microscopy (HRTEM) images is demonstrated with the help of a detailed comparison between experimental HRTEM images of recrystallized silicon (including many microtwins) and corresponding dynamical simulations. The analysis points to an important fact: The shape effect of microtwins leads to artificial contrasts. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

[1]  K. Furuya,et al.  Nanoparticles in interlayers of Bi2O3-doped ZnO ceramics , 2005 .

[2]  K. Furuya,et al.  Microstructures formed in recrystallized Si , 2004 .

[3]  E. Abe,et al.  Transmission electron microscopy study of the evolution of precipitates in aged Al–Li–Cu alloys: the θ′ and T1 phases , 2003 .

[4]  Y. Takai,et al.  Atomic level characterization of ultrathin flat cobalt disilicide film with three crystalline domains , 2002 .

[5]  Xiaowen Zhang,et al.  Electron diffraction and HREM study of a short-range ordered structure in the relaxor ferroelectric P b ( M g 1 / 3 Nb 2 / 3 ) O 3 , 2001 .

[6]  Yimei Zhu,et al.  Crystallographic analysis of orientational domain variants and charge-ordered domains in La 0.33 Ca 0.67 MnO 3 , 2001 .

[7]  D. Muller,et al.  The electronic structure at the atomic scale of ultrathin gate oxides , 1999, Nature.

[8]  S. Hara,et al.  A two-dimensional Bloch-wave method for dynamical RHEED calculations , 1998 .

[9]  Y. Masumoto,et al.  On the origin of visible photoluminescence in nanometer-size Ge crystallites , 1992 .

[10]  Takashi Hirotsu.  Electron Diffraction and High-Resolution Electron Microscopy Study on the Structure of Solid C60 , 1992 .

[11]  A. G. Cullis,et al.  Visible light emission due to quantum size effects in highly porous crystalline silicon , 1991, Nature.

[12]  S. Iijima.  Fine Particles of Silicon. I. Crystal Growth of Spherical Particles of Si , 1987 .

[13]  David J. Smith,et al.  Characterization of Si‐implanted and electron‐beam‐annealed silicon‐on‐sapphire using high‐resolution electron microscopy , 1984 .

[14]  A. Ichimiya.  Many-Beam Calculation of Reflection High Energy Electron Diffraction (RHEED) Intensities by the Multi-Slice Method , 1983 .

[15]  P. Maksym,et al.  A theory of rheed , 1981 .

[16]  G. Tendeloo,et al.  Long‐period antiphase boundary structures in the ordered alloy Au4Zn. I. One‐dimensional long‐period antiphase boundary structure , 1977 .