Analysis of chaos in fluidization using electrical capacitance tomography
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Robert F. Mudde | R. Mudde | JC Jaap Schouten | F T Kühn | C. M. van den Bleek | B Scarlett | F. Kühn | J. J. Schouten | C. Bleek | B. Scarlett | F T Kühn | J C Schouten
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