Trapping Effects in Si -Doped -Ga2O3 MESFETs on an Fe-Doped -Ga2O3 Substrate
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S. Lodha | S. Ringel | S. Rajan | A. Arehart | Yuewei Zhang | Zhanbo Xia | Joe F. Mcglone | C. Joishi
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S. Lodha | S. Ringel | S. Rajan | A. Arehart | Yuewei Zhang | Zhanbo Xia | Joe F. Mcglone | C. Joishi