Study of the GaAs–Au and Si–SiO2 interface formation by the Kelvin method
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J. Palau | L. Lassabatère | J. Bonnet | A. Ismail | C. Raisin | L. Soonckindt | E. Vieujot-Testemale
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J. Palau | L. Lassabatère | J. Bonnet | A. Ismail | C. Raisin | L. Soonckindt | E. Vieujot-Testemale