论文信息 - Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface - 字舞流文

Importance of charging in atomic resolution scanning tunneling microscopy:Study of a single phosphorus atom in a Si(001) surface

S. R. Schofield | D. Mckenzie | H. Wilson | T. Reusch | M. Simmons | N. Marks | M. Radny | N. Curson | Phillip V. Smith | O. Warschkow