Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments
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Zhili Chen | Zhengfeng Huang | Tianming Ni | Patrick Girard | Xiaoqing Wen | Aibin Yan | Jie Cui | Zhelong Xu | Xiangfeng Feng | P. Girard | X. Wen | Zhengfeng Huang | Tianming Ni | Aibin Yan | Zhili Chen | Zhelong Xu | Jie Cui | Xiangfeng Feng