Intra-unit-cell electronic nematicity of the high-Tc copper-oxide pseudogap states
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J. Sethna | H. Eisaki | M. Lawler | S. Uchida | K. Fujita | Y. Kohsaka | A. Schmidt | Jhinhwan Lee | Eun-Ah Kim | Chung Koo Kim | K. Fujita | J. C. Davis | J. C. Davis | J. C. Davis | J. C. Davis