An X-ray device for continuous tracking of moving interfaces in crystalline solids

An X-ray interface continuous tracking device was developed, which enables continuous tracking of interface motion in crystalline solids. The device utilizes X-ray diffraction rather than optical methods to determine a boundary position and allows one to determine the velocity of migration at any moment of the experiment. The device was particularly designed to investigate grain boundary migration. The measurable velocity ranges from 1 to 1000 mu m s-1 with a temporal resolution of about five measurements per second.