Cross-Technology, Cross-Layer Defect Detection in IT Systems -- Challenges and Achievements
暂无分享,去创建一个
Although critical for delivering resilient, secure, efficient, and easily changed IT systems, cross-technology, cross- layer quality defect detection in IT systems still faces hurdles. Two hurdles involve the absence of an absolute target architecture and the difficulty of apprehending multi-component anti-patterns. However, Static analysis and measurement technologies are now able to both consume contextual input and detect system-level anti-patterns. This paper will provide several examples of the information required to detect system-level anti-patterns using examples from the Common Weakness Enumeration repository maintained by MITRE Corp.
[1] Bob Martin,et al. 2010 CWE/SANS Top 25 Most Dangerous Software Errors , 2010 .
[2] Andriy V. Miranskyy,et al. Characteristics of multiple-component defects and architectural hotspots: a large system case study , 2011, Empirical Software Engineering.
[3] Dirk Fox,et al. Open Web Application Security Project , 2006, Datenschutz und Datensicherheit - DuD.