论文信息 - Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7 - 字舞流文

Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

C. Gerber | E. Meyer | H. Güntherodt | L. Howald | R. Lüthi | A. Baratoff | M. Bammerlin | T. Lehmann