IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit

The implementation of an Off-Chip IDDQ monitor to support the test of complex ASICs is presented in this paper. The monitor can be incorporated into a standard automated test equipment (ATE). It is capable of driving a 2mF capacitive load and can perform measurements of the IDDQ of a device under test (DUT) in the 0-1mA range. According to measurements the monitor can operate at the test rates up to 30kHz and offers an resolution better than 0.1mA. The on-chip integrated bypass switch is capable of handling DUT transient currents up to several amps. The IOCIMU prototype was fabricated in the 2-mm Mietec BiCMOS technology and has an active chip area of 20mm2.