Surface Characterization and Defect Detection by Analysis of Images Obtained with Coherent Light

Abstract The paper presents a new approach to surface characterization by means of digital image analysis. The images obtained through the diffraction of a concentrated beam of coherent light exploring the surface, are the Fourier transform of the surface roughness. The features extracted from the images depend on the surface typology and local defects. The experimental work is a contribution to the development of surface quality control systems without direct contact.