Synchronous semiconductor memory device

PURPOSE: A synchronous semiconductor memory device is provided to reduce a test time required for all banks to be tested by operating all banks using only one input signal. CONSTITUTION: In a synchronous semiconductor memory device having a plurality of bank regions(BANK0,BANK1), row enable parts(12,22) correspond to the bank regions of the memory device and independently operate in response to an externally applied bank select signal(BANK_SEL). The row enable parts(12,22) operate at all bank regions regardless of the bank select signal at a test mode. Column enable parts(14,24) correspond to the bank regions, respectively, and operate at a bank region selected by a bank select signal inputted at the test mode.