Thermal sub-modeling of the wirebonded plastic ball grid array package

Numerical simulation of the steady-state thermal behavior of the plastic ball grid array (PBGA) package can be greatly eased through the use of appropriate thermal sub-models. Detailed heat conduction models are used to characterize the thermal constriction effects of the solder sphere array connecting the PBGA to the printed wiring board (PWB) and the thermal vias in the PBGA substrate. The results of the sub-models allow the use of more accurate, yet geometrically-simpler entities in a finite-element (FE) or control-volume simulation, thereby shortening the overall cycle time required for a given analysis. Thermal performance of a PBGA mounted on a standard thermal test board is simulated through FE and computational fluid dynamics (CFD) methods and compared to experimental data from 225- and 357-lead PBGAs.

[1]  David P. Kennedy,et al.  Spreading Resistance in Cylindrical Semiconductor Devices , 1960 .

[2]  D. J. Nelson,et al.  A comparison of two-dimensional planar, axisymmetric and three-dimensional spreading resistances , 1992, [1992 Proceedings] Eighth Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

[3]  R. A. Sherif,et al.  Thermal analysis of a substrate with power dissipation in the vias , 1992 .

[4]  M. Michael Yovanovich,et al.  Analysis of thermal vias in high density interconnect technology , 1992, [1992 Proceedings] Eighth Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

[5]  Eric Beyne,et al.  Modelling of thermal vias in thin film multichip modules , 1994, Proceedings of 1994 4th Intersociety Conference on Thermal Phenomena in Electronic Systems (I-THERM).

[6]  B. M. Guenin,et al.  Analysis of a thermally enhanced ball grid array package , 1995, Proceedings of 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM).

[7]  A. Mertol Thermal performance comparison of high pin count cavity-up enhanced plastic ball grid array (EPBGA) packages , 1996, InterSociety Conference on Thermal Phenomena in Electronic Systems, I-THERM V.