Thermal stability and performance reliability of Pt/Ti/WSi/Ni ohmic contacts to n-SiC for high temperature and pulsed power device applications
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Melanie W. Cole | Matthew H. Ervin | Pooran Chandra Joshi | M. Ervin | J. Demaree | P. Joshi | M. Cole | C. Hubbard | John D. Demaree | C. Hubbard
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