Calculation of hot electron distributions in silicon by means of an evolutionary algorithm
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[1] Norman G. Einspruch,et al. Advanced MOS device physics , 1989 .
[2] J. Bude,et al. Impact ionization and distribution functions in sub-micron nMOSFET technologies , 1995, IEEE Electron Device Letters.
[3] Emile H. L. Aarts,et al. Simulated Annealing: Theory and Applications , 1987, Mathematics and Its Applications.
[4] Karl Hess,et al. Band-structure-dependent transport and impact ionization in GaAs , 1981 .
[5] R. Mittra,et al. Design of lightweight, broad-band microwave absorbers using genetic algorithms , 1993 .
[6] David E. Goldberg,et al. Genetic Algorithms in Search Optimization and Machine Learning , 1988 .
[7] Chimoon Huang,et al. Modeling hot-electron gate current in Si MOSFET's using a coupled drift-diffusion and Monte Carlo method , 1992 .
[8] Zbigniew Michalewicz,et al. Genetic Algorithms + Data Structures = Evolution Programs , 1996, Springer Berlin Heidelberg.
[9] Karl Hess,et al. Monte Carlo Device Simulation: Full Band and Beyond , 1991 .
[10] W. Shockley. Problems related to p-n junctions in silicon , 1961 .
[11] J. Jakumeit. Genetic algorithms: A new approach to energy balance equations , 1995 .