论文信息 - An approach to analog fault diagnosis using genetic algorithms

An approach to analog fault diagnosis using genetic algorithms

A procedure for the multifrequency fault diagnosis of analog circuits is presented. It permits, by means of an optimization procedure based on a genetic algorithm, to select the set of frequencies which better leads to locate parametric faults in analog circuits. By exploiting symbolic analysis techniques, a program implementing the proposed procedure has been developed. An example of the application is also included.

F. Grasso | S. Manetti | M.C. Piccirilli

[1] Bozena Kaminska,et al. Multifrequency Analysis of Faults in Analog Circuits , 1995, IEEE Des. Test Comput..

[2] B. Kaminska,et al. Fault observability analysis of analog circuits in frequency domain , 1996 .

[3] Yuen-Haw Chang,et al. Robust fault diagnosis for large-scale analog circuits with measurement noises , 1997 .

[4] James Demmel,et al. Applied Numerical Linear Algebra , 1997 .

[5] Stefano Manetti,et al. Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits , 1999 .

[6] Stefano Manetti,et al. A singular-value decomposition approach for ambiguity group determination in analog circuits , 2003 .

[7] C.-J. Richard Shi,et al. Automatic test generation of linear analog circuits under parameter variations , 1998, Proceedings of 1998 Asia and South Pacific Design Automation Conference.