论文信息 - Application of Kohonen and supervised forced organisation maps to fault diagnosis in CMOS opamps

Application of Kohonen and supervised forced organisation maps to fault diagnosis in CMOS opamps

Transistors with gate oxide shorts have been identified to 100% fault coverage in a CMOS opamp by monitoring supply current changes first using multilayer perceptrons and then Kohonen maps to resolve any ambiguities. A supervised forced organisation map allows the location and resistance of the short to be determined.

[1] I. M. Bell,et al. Neural network approach to fault diagnosis in CMOS opamps with gate oxide short faults , 1994 .

[2] Teuvo Kohonen,et al. The self-organizing map , 1990 .