Transient avalanche oscillation of IGBTs under high current

Under high current, a new type of high frequency oscillation is found during the turn off of 3.3 kV IGBTs with trench gate structure. Measurements and simulations indicate that the avalanche generation and transit time effect of carriers within the IGBT leads to this oscillation. The transition time effect takes place during rise of collector voltage at turn-off, especially during the dynamic avalanche phase. The range of frequencies is at several 100 MHz. As the oscillation occurs only transiently, during dynamic avalanche, it is named - Transient Avalanche Oscillation (TA-Oscillation). Both the IMPATT- and PETT-mechanisms are found to be involved in the TA-Oscillation. Detailed investigations of the TA-Oscillation on a special development version of a 3.3 kV IGBT led to measures to suppress and avoid such an oscillation. A consequence of preventing this oscillation is proved as an improvement in robustness during turn-off.

[1]  T. Laska,et al.  The Field Stop IGBT (FS IGBT). A new power device concept with a great improvement potential , 2000, 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094).

[2]  I. Omura,et al.  Critical IGBT Design Regarding EMI and Switching Losses , 2008, 2008 20th International Symposium on Power Semiconductor Devices and IC's.

[3]  Thomas Basler,et al.  Ruggedness of High-Voltage IGBTs and Protection Solutions , 2013 .

[4]  W. Fichtner,et al.  Oscillation effects in IGBT's related to negative capacitance phenomena , 1999 .

[5]  H. Schlangenotto,et al.  Dynamischer Avalanche beim Abschalten von GTO-Thyristoren und IGBTs , 1989 .

[6]  Josef Lutz,et al.  Determination of parameters of radiation induced traps in silicon , 2002 .

[7]  T. V. D. Roer D.C. and small-signal A.C. properties of silicon Baritt diodes , 1977 .

[8]  Ichiro Omura,et al.  A 4500 V injection enhanced insulated gate bipolar transistor (IEGT) operating in a mode similar to a thyristor , 1993, Proceedings of IEEE International Electron Devices Meeting.

[9]  W. Zimmermann,et al.  Leistungshalbleiter-Modul mit parallelgeschalteten IGBT-Chips und zusätzlicher Verbindung der Emitterkontakte , 1995 .

[10]  R. Siemieniec,et al.  Analysis of dynamic impatt oscillations caused by radiation induced deep centres with local and homogenous vertical distribution , 2004, ISPSD 2004.

[11]  Ichiro Omura,et al.  Carrier injection enhancement effect of high voltage MOS devices-device physics and design concept , 1997, Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's.

[12]  M. E. Hines,et al.  Electronic tuning effects in the read microwave avalanche diode , 1966 .

[13]  R. Siemieniec,et al.  Applying device simulation for lifetime-controlled devices , 2002, Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611).

[14]  S. Fujita,et al.  Investigation on IGBT High-Frequency Plasma Extraction Transient Time Oscillation , 2009, IEEE Transactions on Power Electronics.

[15]  S. M. Sze Physics of semiconductor devices /2nd edition/ , 1981 .

[16]  R. Siemieniec Transit Time Oscillations as a Source of EMC Problems in Bipolar Power Devices , 2003 .

[17]  Josef Lutz,et al.  Semiconductor Power Devices , 2011 .

[18]  Munaf Rahimo,et al.  Extending the boundary limits of high voltage IGBTs and diodes to above 8 kV , 2002, Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics.

[19]  Daniel Domes,et al.  Power circuit design for clean switching , 2010, 2010 6th International Conference on Integrated Power Electronics Systems.

[20]  Josef Lutz,et al.  On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche , 2003 .

[21]  D. Silber,et al.  Plasma extraction transit time oscillations in bipolar power devices , 2002 .

[22]  J. Lutz,et al.  The plasma extraction transit-time oscillation in bipolar power Devices-Mechanism,EMC effects, and prevention , 2006, IEEE Transactions on Electron Devices.

[23]  J. Lutz,et al.  IMPATT oscillations in fast recovery diodes due to temporarily charged radiation-induced deep levels , 1998 .

[24]  W. Shockley Currents to Conductors Induced by a Moving Point Charge , 1938 .

[25]  P. Mourick,et al.  Ultra high frequency oscillations in the reverse recovery current of fast diodes , 2002, Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics.