Transient avalanche oscillation of IGBTs under high current
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Josef Lutz | Tao Hong | Frank Pfirsch | Dieter Silber | J. Lutz | D. Silber | T. Hong | F. Pfirsch | Bayerer Reinhold | Bayerer Reinhold
[1] T. Laska,et al. The Field Stop IGBT (FS IGBT). A new power device concept with a great improvement potential , 2000, 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094).
[2] I. Omura,et al. Critical IGBT Design Regarding EMI and Switching Losses , 2008, 2008 20th International Symposium on Power Semiconductor Devices and IC's.
[3] Thomas Basler,et al. Ruggedness of High-Voltage IGBTs and Protection Solutions , 2013 .
[4] W. Fichtner,et al. Oscillation effects in IGBT's related to negative capacitance phenomena , 1999 .
[5] H. Schlangenotto,et al. Dynamischer Avalanche beim Abschalten von GTO-Thyristoren und IGBTs , 1989 .
[6] Josef Lutz,et al. Determination of parameters of radiation induced traps in silicon , 2002 .
[7] T. V. D. Roer. D.C. and small-signal A.C. properties of silicon Baritt diodes , 1977 .
[8] Ichiro Omura,et al. A 4500 V injection enhanced insulated gate bipolar transistor (IEGT) operating in a mode similar to a thyristor , 1993, Proceedings of IEEE International Electron Devices Meeting.
[9] W. Zimmermann,et al. Leistungshalbleiter-Modul mit parallelgeschalteten IGBT-Chips und zusätzlicher Verbindung der Emitterkontakte , 1995 .
[10] R. Siemieniec,et al. Analysis of dynamic impatt oscillations caused by radiation induced deep centres with local and homogenous vertical distribution , 2004, ISPSD 2004.
[11] Ichiro Omura,et al. Carrier injection enhancement effect of high voltage MOS devices-device physics and design concept , 1997, Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's.
[12] M. E. Hines,et al. Electronic tuning effects in the read microwave avalanche diode , 1966 .
[13] R. Siemieniec,et al. Applying device simulation for lifetime-controlled devices , 2002, Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611).
[14] S. Fujita,et al. Investigation on IGBT High-Frequency Plasma Extraction Transient Time Oscillation , 2009, IEEE Transactions on Power Electronics.
[15] S. M. Sze. Physics of semiconductor devices /2nd edition/ , 1981 .
[16] R. Siemieniec. Transit Time Oscillations as a Source of EMC Problems in Bipolar Power Devices , 2003 .
[17] Josef Lutz,et al. Semiconductor Power Devices , 2011 .
[18] Munaf Rahimo,et al. Extending the boundary limits of high voltage IGBTs and diodes to above 8 kV , 2002, Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics.
[19] Daniel Domes,et al. Power circuit design for clean switching , 2010, 2010 6th International Conference on Integrated Power Electronics Systems.
[20] Josef Lutz,et al. On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche , 2003 .
[21] D. Silber,et al. Plasma extraction transit time oscillations in bipolar power devices , 2002 .
[22] J. Lutz,et al. The plasma extraction transit-time oscillation in bipolar power Devices-Mechanism,EMC effects, and prevention , 2006, IEEE Transactions on Electron Devices.
[23] J. Lutz,et al. IMPATT oscillations in fast recovery diodes due to temporarily charged radiation-induced deep levels , 1998 .
[24] W. Shockley. Currents to Conductors Induced by a Moving Point Charge , 1938 .
[25] P. Mourick,et al. Ultra high frequency oscillations in the reverse recovery current of fast diodes , 2002, Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics.