High crystal quality strained Si0.5Ge0.5 layer with a thickness of up to 50 nm grown on the three-layer SiGe strain relaxed buffer
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Guilei Wang | Jun Luo | Junfeng Li | H. Yin | Wenwu Wang | Qingzhu Zhang | Shihai Gu | Gaobo Xu | Xiaolei Wang | Hong Yang | Yongliang Li | Zhiqian Zhao | Yan Li | Xueli Ma | Junjie Li