In Situ Synchrotron X-Ray Topography Observation of Double-Ended Frank-Read Sources in PVT-Grown 4H-SiC Wafers
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A. Danilewsky | P. McNally | M. Dudley | B. Raghothamachar | Jianqiu Guo | Yu Yang | Swetlana Weit | Brian R. Tanner
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