A critical evaluation of high energy electron impact spectroscopy to measure Compton profiles A D Barlas, W H E Rueckner and H F Wellenstein Elastic, inelastic and total cross sections for X-ray and electron scattering from molecular silane

Elastic, inelastic and total cross sections for X-ray and electron scattering calculated using high quality SCF molecular wavefunctions for silane (SiH4) are presented. The effects of basis set choice and free rotation on these cross sections are investigated. The effect of molecular binding and various other trends and systematics in the cross sections have been examined with the help of difference functions obtained by subtracting the appropriate independent atom model (IAM) cross section from the molecular cross section. The probability density for the interelectronic distance (radial intracule density) is obtained and analysed.

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