Scan-chain is a well-established design-for-testability (DFT) methodology used for testing digital circuits. As SoC complexity increases, thousands of registers can be used in a design, which makes it difficult to implement full-scan testing. More so, as the complexity of the scan algorithm is dependent on the number of design registers, large SoC scan designs can no longer be verified in RTL simulation unless portioned into smaller sub-blocks. This paper proposes a methodology to decrease scan-chain verification time utilizing SCE-MI (Standard for Co-Emulation Modeling Interface protocol) and an FPGA-based emulation platform. A high-level (SystemC) testbench and FPGA synthesizable hardware transactor models are developed for the ISCAS89 S400 benchmark circuit for high-speed communications between the CPU workstation and the FPGA emulator. The emulation results are compared to other verification methodologies, and found to be 82% faster than regular RTL simulation. In addition, the emulation runs in the MHz speed range, allowing the incorporation of software applications, drivers, and operating systems, as opposed to the Hz range in RTL simulation.
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