High-cycle fatigue strength and small-crack growth behavior of ultrafine-grained copper with post-ECAP annealing
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M. Goto | Je-hyun Lee | Sang Shik Kim | K. Euh | S. Kim | S. Han | T. Yakushiji | N. Teshima
暂无分享,去创建一个
M. Goto | Je-hyun Lee | Sang Shik Kim | K. Euh | S. Kim | S. Han | T. Yakushiji | N. Teshima